(a) Illustration showing an atomic force microscope (AFM) tip indenting the transition-metal dichalcogenide/polymer structure to introduce local strain. (b) Patterned single photon emission in tungsten diselenide (WSe2) induced by AFM indentation of the letters “NRL” and “AFRL”. (c) AFM indents produce single photon emitter “ornaments” on a monolayer WSe2 “Christmas tree.”
Date Taken: | 02.14.2019 |
Date Posted: | 02.14.2019 10:55 |
Photo ID: | 5105671 |
VIRIN: | 190214-N-NO204-401 |
Resolution: | 4750x4950 |
Size: | 1.39 MB |
Location: | US |
Web Views: | 31 |
Downloads: | 5 |
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