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DAMAGED TEST SAMPLE WITH HIGH VOLTAGE IN A VACUUM CHAMBER
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DAMAGED TEST SAMPLE WITH HIGH VOLTAGE IN A VACUUM CHAMBER
NASA Identifier: GRC-C-2000-509
Date Taken: |
09.17.2009 |
Date Posted: |
02.08.2013 03:55 |
Photo ID: |
834753 |
Resolution: |
3000x2400 |
Size: |
3.7 MB |
Location: |
WASHINGTON, D.C., US |
Web Views: |
10 |
Downloads: |
2 |
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